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analog_loop tests update for STM32 #3024

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merged 2 commits into from
Oct 27, 2016
Merged

analog_loop tests update for STM32 #3024

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dee7537
analog_loop tests update for STM32
jeromecoutant Oct 12, 2016
78b4f25
analog_loop test - keep mcu list and update with STM32 boards
jeromecoutant Oct 19, 2016
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24 changes: 18 additions & 6 deletions features/unsupported/tests/mbed/analog/main.cpp
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Original file line number Diff line number Diff line change
Expand Up @@ -28,6 +28,8 @@ AnalogOut out(PTE30);
AnalogIn in(A0);
AnalogOut out(D12); //D12 is P0_12, the DAC output pin

// no pin to access DAC on these targets:
//TARGET_DISCO_F746NG
// No DAC on these targets:
//TARGET_NUCLEO_F030R8
//TARGET_NUCLEO_F070RB
Expand All @@ -40,32 +42,42 @@ AnalogOut out(D12); //D12 is P0_12, the DAC output pin
defined(TARGET_NUCLEO_F303RE) || \
defined(TARGET_NUCLEO_F334R8) || \
defined(TARGET_NUCLEO_F446RE) || \
defined(TARGET_NUCLEO_F446ZE) || \
defined(TARGET_NUCLEO_L053R8) || \
defined(TARGET_NUCLEO_L073RZ) || \
defined(TARGET_NUCLEO_L476RG) || \
defined(TARGET_NUCLEO_L152RE)
AnalogIn in(A0);
AnalogOut out(A2);

#elif defined(TARGET_NUCLEO_F746ZG)
#elif defined(TARGET_NUCLEO_F303K8)
AnalogIn in(A0);
AnalogOut out(PA_4);
AnalogOut out(A3);

#elif defined(TARGET_NUCLEO_F207ZG)
#elif defined(TARGET_NUCLEO_F207ZG) || \
defined(TARGET_NUCLEO_F746ZG) || \
defined(TARGET_NUCLEO_F303ZE) || \
defined(TARGET_NUCLEO_F410RB) || \
defined(TARGET_NUCLEO_F446ZE) || \
defined(TARGET_NUCLEO_F429ZI)
AnalogIn in(A0);
AnalogOut out(D13);

#elif defined(TARGET_ARCH_MAX)
AnalogIn in(PA_0);
AnalogOut out(PA_4);

#elif defined(TARGET_DISCO_L053C8) || \
defined(TARGET_DISCO_F334C8)
AnalogIn in(PA_1);
AnalogOut out(PA_4);

#elif defined(TARGET_DISCO_F407VG) || \
defined(TARGET_DISCO_F469NI)
AnalogIn in(PC_5);
AnalogOut out(PA_4);

#elif defined(TARGET_NUCLEO_F303ZE)
AnalogIn in(PC_5);
#elif defined(TARGET_DISCO_L476VG)
AnalogIn in(PA_0);
AnalogOut out(PA_5);

#elif defined(TARGET_DISCO_F429ZI)
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8 changes: 2 additions & 6 deletions tools/tests.py
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Original file line number Diff line number Diff line change
Expand Up @@ -70,6 +70,8 @@

* analog_loop (AnalogIn, AnalogOut):
* Arduino headers: (A0 <-> A5)
* NUCLEO64: (A0 <-> A2)
* NUCLEO144: (A0 <-> D13)
* LPC1549: (A0 <-> D12)
* LPC1*: (p17 <-> p18 )
* KL25Z: (PTE30 <-> PTC2)
Expand Down Expand Up @@ -187,12 +189,6 @@
"dependencies": [MBED_LIBRARIES, TEST_MBED_LIB],
"automated": True,
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I'm thinking we probably don't want to remove the non-ST boards from this list, as the other boards still require some customization of the pins. Would you mind adding the non-ST boards back to this list?

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yes, I can...
but as there is a check if analog in and out are supported or not in the test,
and test can not be executed while "peripherals" parameter is not set,
I ddidn't see any risk to remove the MCU list

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Its not so much that they wouldn't have analog in or out supported, its that the pin names used for the analog loop are only defined for the targets in the mcu list. It would lead to a build error.

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mcu list is back :-)

"peripherals": ["analog_loop"],
"mcu": ["LPC1768", "LPC2368", "LPC2460", "KL25Z", "K64F", "K66F", "K22F", "LPC4088", "LPC1549",
"NUCLEO_F072RB", "NUCLEO_F091RC", "NUCLEO_F302R8", "NUCLEO_F303K8", "NUCLEO_F303RE", "NUCLEO_F207ZG",
"NUCLEO_F334R8", "NUCLEO_F303ZE", "NUCLEO_L053R8", "NUCLEO_L073RZ", "NUCLEO_L152RE",
"NUCLEO_F410RB", "NUCLEO_F411RE", "NUCLEO_F446RE", "NUCLEO_F446ZE",
"DISCO_F407VG", "DISCO_F746NG", "NUCLEO_F746ZG",
"ARCH_MAX", "MAX32600MBED", "MOTE_L152RC", "B96B_F446VE"]
},
{
"id": "MBED_A9", "description": "Serial Echo at 115200",
Expand Down